The camera-based system is the most common method for pulsed laser beam profiling. Cameras are used to track and measure the beam’s width. The applications of such systems are numerous and diverse. Find out the benefits of SWIR camera-based systems for laser beam profiling.
Advantages of Silicon-based Optical Systems
Silicon-based charge-coupled devices and silicon-based complementary metal-oxide-semiconductors (e.g. CCDs or CMOS) are often used in high-performance imaging applications and can detect wavelengths that extend from soft xrays to the near infrared (NIR). In general the quantum efficiency of CCDs decreases as the detection wavelength expands to the NIR range. At wavelengths in excess of 1100 nanometers,traditional CCDs and CMOS system light is not absorbed by a silicon crystal as the photons in this type of light do not have enough energy to cause an electron to leap.
The latter model has large area sensors with the highest resolution. It is vital for obtaining accurate measurements of small and massive laser beams. Both types of profilers count wavelengths from UV through near-infrared (IR).
SWIR Vision Systems has a proprietary series of cameras that feature an 800 to 1,700 nm wideband image sensor technology for laser beam profiling that is based on colloidal quantum dots (CQD) – thin film photodiodes constructed in a single piece out of quartz wafers for reading. They could achieve the same thing for SWIR imaging the same thing that CMOS image sensors and micro-bolometer arrays did for visible and longwave imaging as well as visible infrared imaging. CQD laser imaging sensors from SWIR are available in both camera-based as well as camera-less variants.
Before making a final decision regarding the detector to use to detect the object,it is important to be aware of every aspect of the application and how wavelengths react.
Selecting an optical system to perform the measurement of laser beams with pulses
In terms of the application of the technology,there’s no one-size-fits-all profilers available,as various lasers have different wavelengths. Additionally,the lasers are equipped with different beam dimensions and powers,meaning it is necessary to use different optical equipment. The optical systems should be equipped with wavelength-specific attenuators,as well as antireflective coatings to accurately detect the spectrum. These variations can cause errors in measuring processes.
Camera-based systems for laser beams profiling are the most popular choice when it comes to large-scale beam measurements. These systems use an CMOS-based or photodiode-based sensor to identify the wavelength. Camera-based systems can be utilized in many different ways,including in both industrial settings,studies and research,and for military purposes.
Camera-based systems for the pulsed beam profiler offer numerous advantages over devices based on slits. Slit-based systems can be used to measure the intensity of very small beams directly,while camera-based systems can measure both concentrated and unfocused beams. They are especially beneficial in factory floor applications in which accuracy and reliability are crucial.
Camera-based systems that use the pulsed beam profiler are extremely sensitive to the effects of low-linewidth laser beams. The artifacts are eliminated through careful optical design.
The camera-based system is an excellent choice for many applications.The cameras used for pulsed laser beam profiling are generally C-mount compatible. The camera head doesn’t have a faceplate that is in front of the chip that is used for sensor and there’s no requirement to purchase an additional ND filter (the filters filter out ambient light from on the chip).
Unlike conventional laser beam measurements that require the use of a lens with a fixed aperture in order to view a beam,Acuros CDQ Sensors can laser beam profile with or without cameras. A camera isn’t the best choice for large beam applications since it’s not able to capture beams of smaller dimensions.
Applications
Applications of SWIR Laser Beam Profiling are extremely diverse. These measurements are useful for a wide range of processes that include laser collimation as well as characterization. There are many advantages to making use of a CCD beam profiler for instance the ability to measure astigmatism,as well as the ability to change direction around the beam’s path. For example an CCD beam profiler is able to measure the astigmatism of a laser beam,that is essential for measuring for astigmatism when imaging medically. Furthermore the CCD beam profiler can measure astigmatism without a cover glass. Moreover,the absence of a cover glass is an important feature of CCD beam profiler. Although a CCD camera might not be suitable for all applications,it is frequently preferable to use for SWIR laser beam monitoring,according to the particular application in hand.
